Diagnosis of hold time defects

TitleDiagnosis of hold time defects
Publication TypeConference Paper
Year of Publication2004
AuthorsWang, Z, Marek-Sadowska, M, Tsai, K-H, Rajski, J
Conference NameComputer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on
Date Publishedoct.
Keywordscircuit timing information, failure analysis, fault diagnosis, hold time defect diagnosis, hold time fault diagnosis, hold time violations, timing circuits, timing window propagation
AbstractIn modern technologies, process variations can be quite substantial, often causing design timing failures. It is essential that those errors be correctly and quickly diagnosed. In this work, we analyze failures caused by the hold-time-violations. We investigate the feasibility of using circuit-timing information to guide the hold-time-fault diagnosis. We propose a novel and efficient diagnostic approach based on timing window propagation. For each identified candidate, our method locates the source of the hold-time violation and determines the most probable defect size. Experimental results indicate that the new method diagnoses hold-time related defects with very good resolution.