Publications

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J. - Y. Wuu, Pikus, F. G., Torres, A., and Marek-Sadowska, M., “Rapid layout pattern classification”, in Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific, 2011, pp. 781 -786.
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J. - Y. Wuu, Pikus, F. G., and Marek-Sadowska, M., “Metrics for characterizing machine learning-based hotspot detection methods”, in Quality Electronic Design (ISQED), 2011 12th International Symposium on, 2011, pp. 1 -6.
F
J. - Y. Wuu, Pikus, F. G., and Marek-Sadowska, M., “Fast and simple modeling of non-rectangular transistors”, in Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, 2008, vol. 7122.
E
J. - Y. Wuu, Pikus, F. G., Marek-Sadowska, M., and Rieger, M. L., “Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching”, in Design for Manufacturability through Design-Process Integration V, 2011, vol. 7974.
D
J. - Y. Wuu, Pikus, F. G., Torres, A., Marek-Sadowska, M., Singh, V. K., and Rieger, M. L., “Detecting context sensitive hot spots in standard cell libraries”, in Design for Manufacturability through Design-Process Integration III, 2009, vol. 7275, p. 727515.