Publications

Found 6 results
Filters: Keyword is logic testing and Author is Janusz Rajski  [Clear All Filters]
1997
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Scan encoded test pattern generation for BIST, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
1999
K. - H. Tsai, Tompson, R., Rajski, J., and Marek-Sadowska, M., STAR-ATPG: a high speed test pattern generator for large scan designs, in Test Conference, 1999. Proceedings. International, 1999, pp. 1021 -1030.
2000
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Star test: the theory and its applications, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
2004
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis using timing information, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
2005
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay-fault diagnosis using timing information, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
2006
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Analysis and methodology for multiple-fault diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.