Publications

Found 6 results
Filters: Keyword is logic testing and Author is Janusz Rajski  [Clear All Filters]
2006
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Analysis and methodology for multiple-fault diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.
2005
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay-fault diagnosis using timing information”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
2004
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay fault diagnosis using timing information”, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
2000
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Star test: the theory and its applications”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
1999
K. - H. Tsai, Tompson, R., Rajski, J., and Marek-Sadowska, M., “STAR-ATPG: a high speed test pattern generator for large scan designs”, in Test Conference, 1999. Proceedings. International, 1999, pp. 1021 -1030.
1997
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Scan encoded test pattern generation for BIST”, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.