Publications

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C. - C. Lin, Marek-Sadowska, M., Lee, T. - C., and Chen, K. - C., Cost-free scan: a low-overhead scan path design, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 852 -861, 1998.
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C. - Y. Yeh and Marek-Sadowska, M., Delay budgeting in sequential circuit with application on FPGA placement, in Design Automation Conference, 2003. Proceedings, 2003, pp. 202 - 207.
Y. Ran and Marek-Sadowska, M., Designing a via-configurable regular fabric, in Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004, 2004, pp. 423 - 426.
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D. Chang, Lee, T. - C., Cheng, K. - T., and Marek-Sadowska, M., Functional scan chain testing, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
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N. Funabiki, Singh, A., Mukherjee, A., and Marek-Sadowska, M., A global routing technique for wave-steered design methodology, in Digital Systems, Design, 2001. Proceedings. Euromicro Symposium on, 2001, pp. 430 -436.
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Y. Ran and Marek-Sadowska, M., An integrated design flow for a via-configurable gate array, in Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on, 2004, pp. 582 - 589.
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A. Singh, Mukherjee, A., and Marek-Sadowska, M., Latency and latch count minimization in wave steered circuits, in Design Automation Conference, 2001. Proceedings, 2001, pp. 383 - 388.
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C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Scan paths through functional logic, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
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C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Test-point insertion: scan paths through functional logic, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.
B. Chen and Marek-Sadowska, M., Timing driven placement of pads and latches, in ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International, 1992, pp. 30 -33.