Publications

Found 6 results
Filters: Keyword is automatic testing and Author is Malgorzata Marek-Sadowska  [Clear All Filters]
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S. - C. Chang, Van Ginneken, L. P. P. P., and Marek-Sadowska, M., “Fast Boolean optimization by rewiring”, in Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on, 1996, pp. 262 -269.
D. Chang, Lee, T. - C., Cheng, K. - T., and Marek-Sadowska, M., “Functional scan chain testing”, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
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Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Multiple fault diagnosis using n-detection tests”, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.
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S. - C. Chang and Marek-Sadowska, M., “Perturb and simplify: optimizing circuits with external don't cares”, in European Design and Test Conference, 1996. ED TC 96. Proceedings, 1996, pp. 402 -406.
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K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Scan encoded test pattern generation for BIST”, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., “Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.