Found 6 results
Filters: Keyword is automatic testing and Author is Malgorzata Marek-Sadowska  [Clear All Filters]
Conference Paper
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Scan paths through functional logic, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Scan encoded test pattern generation for BIST, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
S. - C. Chang and Marek-Sadowska, M., Perturb and simplify: optimizing circuits with external don't cares, in European Design and Test Conference, 1996. ED TC 96. Proceedings, 1996, pp. 402 -406.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Multiple fault diagnosis using n-detection tests, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.
D. Chang, Lee, T. - C., Cheng, K. - T., and Marek-Sadowska, M., Functional scan chain testing, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
S. - C. Chang, Van Ginneken, L. P. P. P., and Marek-Sadowska, M., Fast Boolean optimization by rewiring, in Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on, 1996, pp. 262 -269.