Publications

Found 10 results
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W
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Analysis and methodology for multiple-fault diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.
T
C. - K. Tsai and Marek-Sadowska, M., “Analysis of process variation's effect on SRAM's read stability”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -610.
A. Todri, Marek-Sadowska, M., and Chang, S. - C., “Analysis and optimization of power-gated ICs with multiple power gating configurations”, in Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on, 2007, pp. 783 -790.
M
F. Makedon and Marek-Sadowska, M., “Analysis of Heuristic Reasoning for the Visualization of CAD Quadratic”, in ICCAL '89: Proceedings of the 2nd International Conference on Computer Assisted Learning, 1989, pp. 359–378.
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S. Lin and Marek-Sadowska, M., “An accurate and efficient delay model for CMOS gates in switch-level timing analysis”, in Circuits and Systems, 1990., IEEE International Symposium on, 1990, pp. 856 -860 vol.2.
D
R. Dutta and Marek-Sadowska, M., “Automatic Sizing of Power/Ground (P/G) Networks in VLSI”, in Design Automation, 1989. 26th Conference on, 1989, pp. 783 - 786.
C
L. H. Chen and Marek-Sadowska, M., “Aggressor alignment for worst-case crosstalk noise”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 20, pp. 612 -621, 2001.
L. H. Chen and Marek-Sadowska, M., “Aggressor alignment for worst-case coupling noise”, in ISPD '00: Proceedings of the 2000 international symposium on Physical design, 2000, pp. 48–54.
L. H. Chen and Marek-Sadowska, M., “Aggresors alignment for worst-case coupling noise”, in ICCAD '00: Proceedings of the 2000 international conference on Computer-aided design, 2000, pp. 48–54.
C. - W. Chang and Marek-Sadowska, M., “ATPG-based logic synthesis: an overview”, in Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on, 2002, pp. 786 - 789.