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  • Vertical Slit Field Effect Transistor in ultra-low power applications
  • Can pin access limit the footprint scaling?
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  • On Cell Layout-Performance Relationships in VeSFET-Based, High-Density Regular Circuits
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Closed-Form Crosstalk Noise Delay Metrics

TitleClosed-Form Crosstalk Noise Delay Metrics
Publication TypeJournal Article
Year of Publication2003
AuthorsChen, LH, Marek-Sadowska, M
JournalAnalog Integr. Circuits Signal Process.
Volume35
Pagination143–156
ISSN0925-1030
DOI10.1023/A:1024126531872
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Electrical and Computer Engineering, Harold Frank Hall, University of California, Santa Barbara, CA - 93106.

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