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- Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
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Aggresors alignment for worst-case coupling noise
| Title | Aggresors alignment for worst-case coupling noise |
| Publication Type | Conference Paper |
| Year of Publication | 2000 |
| Authors | Chen, LH, Marek-Sadowska, M |
| Conference Name | ICCAD '00: Proceedings of the 2000 international conference on Computer-aided design |
| Publisher | IEEE Computer Society Press |
| Conference Location | Los Alamitos, CA, USA |
| ISBN Number | 1092-3152 |
