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- Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
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- On Cell Layout-Performance Relationships in VeSFET-Based, High-Density Regular Circuits
Fast post-placement rewiring using easily detectable functional symmetries
| Title | Fast post-placement rewiring using easily detectable functional symmetries |
| Publication Type | Conference Paper |
| Year of Publication | 2000 |
| Authors | Chang, C-W, Cheng, C-K, Suaris, P, Marek-Sadowska, M |
| Conference Name | Design Automation Conference, 2000. Proceedings 2000. 37th |
| Abstract | Not available |
| DOI | 10.1109/DAC.2000.855320 |
