Capturing input switching dependency in crosstalk noise modeling

TitleCapturing input switching dependency in crosstalk noise modeling
Publication TypeConference Paper
Year of Publication2000
AuthorsChen, LH, Marek-Sadowska, M, Divecha, R, Singh, P
Conference NameASIC/SOC Conference, 2000. Proceedings. 13th Annual IEEE International
Keywords0.25 micron, CMOS circuits, CMOS digital integrated circuits, crosstalk, crosstalk noise modeling, driver circuits, equivalent resistances, input switching conditions, input switching dependency capture, integrated circuit modelling, integrated circuit noise, linear model, peak crosstalk noise, signal transition times, switching, technology parameters, victim driver modeling, VLSI
AbstractSimulations of CMOS circuits for different input switching conditions reveal that the peak crosstalk noise can differ significantly for a given circuit structure with specific technology parameters and specific signal transition times. We show that these effects can be captured by appropriate victim driver modeling and we propose a systematic method to find the equivalent resistances for different switching conditions. In 0.25 mu;m technology, the maximum error of our linear model with respect to HSpice simulation using the nonlinear driver model is less than 5%, and the average error is less than 2%