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- Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
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Fine granularity clustering for large scale placement problems
| Title | Fine granularity clustering for large scale placement problems |
| Publication Type | Conference Paper |
| Year of Publication | 2003 |
| Authors | Hu, B, Marek-Sadowska, M |
| Conference Name | ISPD '03: Proceedings of the 2003 international symposium on Physical design |
| Publisher | ACM |
| Conference Location | New York, NY, USA |
| ISBN Number | 1-58113-650-1 |
| DOI | 10.1145/640000.640017 |
