A study of reliability issues in clock distribution networks

TitleA study of reliability issues in clock distribution networks
Publication TypeConference Paper
Year of Publication2008
AuthorsTodri, A, Marek-Sadowska, M
Conference NameComputer Design, 2008. ICCD 2008. IEEE International Conference on
Date Publishedoct.
Keywordsassymetrical bidirectional currents, clock gating, clock mesh distribution networks, clocks, electromigration, electromigration phenomena, grid segments, power supply noise, process variation, reliability
AbstractIn this paper, we present a reliability study of clock mesh distribution networks. We analyze the electromigration (EM) phenomena and demonstrate their occurrence in clock mesh networks (CMN). Due to shrinking feature sizes in more advanced technologies, EM is becoming a more prominent reliability issue. Process variation, power supply noise, and clock gating are some of the factors that can increase electromigration in the clock mesh. We identity the potential EM branches by investigating current flows under various conditions. Our study shows that a clock mesh optimized for certain configurations of clock sinks may experience electromigration due to asymmetrical bidirectional currents flowing in some grid segments.