Publications

Found 5 results
Filters: Author is Vishal Mehta  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
M
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology”, in Test Conference, 2006. ITC '06. IEEE International, 2006, pp. 1-10.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Timing-Aware Multiple-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 28, pp. 245 -258, 2009.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Improving the Resolution of Single-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Timing-Aware Multiple-Delay-Fault Diagnosis”, in Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on, 2008, pp. 246 -253.
V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay fault diagnosis for nonrobust test”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.