- Vertical Slit Field Effect Transistor in ultra-low power applications
- Can pin access limit the footprint scaling?
- A Low Energy Network-on-Chip Fabric for 3-D Multi-Core Architectures
- Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
- Metrics for characterizing machine learning-based hotspot detection methods
- A study on cell-level routing for VeSFET circuits
- On Cell Layout-Performance Relationships in VeSFET-Based, High-Density Regular Circuits
Publications
“Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues”, in Reliability Physics Symposium (IRPS), 2012 IEEE International, 2012, pp. 6A.4.1 -6A.4.9.
, “Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues”, in Reliability Physics Symposium (IRPS), 2012 IEEE International, 2012, pp. 6A.4.1 -6A.4.9.
, “A Test Synthesis Approach To Reducing Ballast Dft Overhead”, in Design Automation Conference, 1997. Proceedings of the 34th, 1997, pp. 466 -471.
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