Publications

Found 10 results
Filters: Keyword is integrated circuit reliability  [Clear All Filters]
2012
F. Chen, Mittl, S., Shinosky, M., Swift, A., Kontra, R., Anderson, B., Aitken, J., Wang, Y., Kinser, E., Kumar, M., Wang, Y., Kane, T., Feng, K. D., Henson, W. K., Mocuta, D., and Li, Di-an, “Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues”, in Reliability Physics Symposium (IRPS), 2012 IEEE International, 2012, pp. 6A.4.1 -6A.4.9.
2011
A. Todri and Marek-Sadowska, M., “Reliability Analysis and Optimization of Power-Gated ICs”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 19, pp. 457 -468, 2011.
2008
A. Todri, Marek-Sadowska, M., and Kozhaya, J., “Power supply noise aware workload assignment for multi-core systems”, in Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on, 2008, pp. 330 -337.
2007
A. Todri, Marek-Sadowska, M., and Chang, S. - C., “Analysis and optimization of power-gated ICs with multiple power gating configurations”, in Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on, 2007, pp. 783 -790.
2006
V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay fault diagnosis for nonrobust test”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
2004
C. - W. Chang, Hsiao, M. - F., Hu, B., Wang, K., Marek-Sadowska, M., Cheng, C. - K., and Chen, S. - J., “Fast postplacement optimization using functional symmetries”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 23, pp. 102 - 118, 2004.
2003
Y. Ran and Marek-Sadowska, M., “Crosstalk noise in FPGAs”, in Design Automation Conference, 2003. Proceedings, 2003, pp. 944 - 949.
K. Wang and Marek-Sadowska, M., “On-chip power supply network optimization using multigrid-based technique”, in Design Automation Conference, 2003. Proceedings, 2003, pp. 113 - 118.
K. Wang and Marek-Sadowska, M., “Power/ground mesh area optimization using multigrid-based technique [IC design]”, in Design, Automation and Test in Europe Conference and Exhibition, 2003, 2003, pp. 850 - 855.
2001
C. - W. Chang, Wang, K., and Marek-Sadowska, M., “Layout-driven hot-carrier degradation minimization using logic restructuring techniques”, in Design Automation Conference, 2001. Proceedings, 2001, pp. 97 - 102.