Publications

Found 7 results
Filters: Keyword is fault diagnosis and Author is Malgorzata Marek-Sadowska  [Clear All Filters]
2009
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Timing-Aware Multiple-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 28, pp. 245 -258, 2009.
2006
V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay fault diagnosis for nonrobust test”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
2005
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay-fault diagnosis using timing information”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
2004
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Diagnosis of hold time defects”, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 192 - 199.
2003
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Multiple fault diagnosis using n-detection tests”, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.
2000
T. Xiao, Chang, C. - W., and Marek-Sadowska, M., “Efficient static timing analysis in presence of crosstalk”, in ASIC/SOC Conference, 2000. Proceedings. 13th Annual IEEE International, 2000, pp. 335 -339.
1997
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., “Scan encoded test pattern generation for BIST”, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.