Publications

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I
V. Mehta, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Improving the Resolution of Single-Delay-Fault Diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.
L. H. Chen and Marek-Sadowska, M., Incremental delay change due to crosstalk noise, in ISPD '02: Proceedings of the 2002 international symposium on Physical design, 2002, pp. 120–125.
Q. Liu, Hu, B., and Marek-Sadowska, M., Individual wire-length prediction with application to timing-driven placement, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 12, pp. 1004 -1014, 2004.
C. - W. Chang, Hu, B., and Marek-Sadowska, M., In-place delay constrained power optimization using functional symmetries, in Design, Automation and Test in Europe, 2001. Conference and Exhibition 2001. Proceedings, 2001, pp. 377 -382.
Y. Ran and Marek-Sadowska, M., An integrated design flow for a via-configurable gate array, in Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on, 2004, pp. 582 - 589.
G. Parthasarathy, Marek-Sadowska, M., Mukherjee, A., and Singh, A., Interconnect complexity-aware FPGA placement using Rent's rule, in SLIP '01: Proceedings of the 2001 international workshop on System-level interconnect prediction, 2001, pp. 115–121.
C. - K. Tsai and Marek-Sadowska, M., An interconnect insensitive linear time-varying driver model for static timing analysis, in Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on, 2005, pp. 654 - 661.
A. Singh, Mukherjee, A., and Marek-Sadowska, M., Interconnect pipelining in a throughput-intensive FPGA architecture, in FPGA '01: Proceedings of the 2001 ACM/SIGDA ninth international symposium on Field programmable gate arrays, 2001, pp. 153–160.
A. Singh, Parthasarathy, G., and Marek-Sadowska, M., Interconnect resource-aware placement for hierarchical FPGAs, in Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on, 2001, pp. 132 -136.
F. Chen, Mittl, S., Shinosky, M., Swift, A., Kontra, R., Anderson, B., Aitken, J., Wang, Y., Kinser, E., Kumar, M., Wang, Y., Kane, T., Feng, K. D., Henson, W. K., Mocuta, D., and Li, Di-an, Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues, in Reliability Physics Symposium (IRPS), 2012 IEEE International, 2012, pp. 6A.4.1 -6A.4.9.