Publications
Found 22 results
Filters: Keyword is logic testing [Clear All Filters]
, “Partitioning sequential circuits on dynamically reconfigurable FPGAs”, Computers, IEEE Transactions on, vol. 48, pp. 565 -578, 1999.
, “Perturb and simplify: multilevel Boolean network optimizer”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 15, pp. 1494 -1504, 1996.
, “A new reasoning scheme for efficient redundancy addition and removal”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 22, pp. 945 - 951, 2003.
, “Fast Boolean optimization by rewiring”, in Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on, 1996, pp. 262 -269.
, “Functional scan chain testing”, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
, “Perturb and simplify: optimizing circuits with external don't cares”, in European Design and Test Conference, 1996. ED TC 96. Proceedings, 1996, pp. 402 -406.
, “Single-pass redundancy-addition-and-removal”, in Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on, 2001, pp. 606 -609.
, “Cost-free scan: a low-overhead scan path design”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 852 -861, 1998.
, “Cost-free scan: a low-overhead scan path design methodology”, in Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on, 1995, pp. 528 -533.
, “Test point insertion: scan paths through combinational logic”, in Design Automation Conference Proceedings 1996, 33rd, 1996, pp. 268 -273.
, “Test-point insertion: scan paths through functional logic”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.
, “Scan paths through functional logic”, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
, “Designing a via-configurable regular fabric”, in Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004, 2004, pp. 423 - 426.
, “Scan encoded test pattern generation for BIST”, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
, “STAR-ATPG: a high speed test pattern generator for large scan designs”, in Test Conference, 1999. Proceedings. International, 1999, pp. 1021 -1030.
, “Logic synthesis for testability”, in VLSI, 1996. Proceedings., Sixth Great Lakes Symposium on, 1996, pp. 118 -121.
, “Star test: the theory and its applications”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
, “Generalized Reed-Muller forms as a tool to detect symmetries”, Computers, IEEE Transactions on, vol. 45, pp. 33 -40, 1996.
, “Analysis and methodology for multiple-fault diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.
, “Delay fault diagnosis using timing information”, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
, “Delay-fault diagnosis using timing information”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
, “Efficient static timing analysis in presence of crosstalk”, in ASIC/SOC Conference, 2000. Proceedings. 13th Annual IEEE International, 2000, pp. 335 -339.
