Publications

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D. Chang, Lee, T. - C., Cheng, K. - T., and Marek-Sadowska, M., Functional scan chain testing, in Design, Automation and Test in Europe, 1998., Proceedings, 1998, pp. 278 -283.
S. - C. Chang and Marek-Sadowska, M., Perturb and simplify: optimizing circuits with external don't cares, in European Design and Test Conference, 1996. ED TC 96. Proceedings, 1996, pp. 402 -406.
C. - W. Chang and Marek-Sadowska, M., Single-pass redundancy-addition-and-removal, in Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on, 2001, pp. 606 -609.
D. Chang and Marek-Sadowska, M., Partitioning sequential circuits on dynamically reconfigurable FPGAs, Computers, IEEE Transactions on, vol. 48, pp. 565 -578, 1999.
S. - C. Chang, Marek-Sadowska, M., and Cheng, K. - T., Perturb and simplify: multilevel Boolean network optimizer, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 15, pp. 1494 -1504, 1996.
C. - W. Chang, Hsiao, M. - F., and Marek-Sadowska, M., A new reasoning scheme for efficient redundancy addition and removal, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 22, pp. 945 - 951, 2003.
S. - C. Chang, Van Ginneken, L. P. P. P., and Marek-Sadowska, M., Fast Boolean optimization by rewiring, in Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on, 1996, pp. 262 -269.
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C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Test-point insertion: scan paths through functional logic, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 838 -851, 1998.
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Scan paths through functional logic, in Custom Integrated Circuits Conference, 1996., Proceedings of the IEEE 1996, 1996, pp. 487 -490.
C. - C. Lin, Marek-Sadowska, M., Lee, T. - C., and Chen, K. - C., Cost-free scan: a low-overhead scan path design, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 17, pp. 852 -861, 1998.
C. - C. Lin, Lee, T. - C., Marek-Sadowska, M., and Chen, K. - C., Cost-free scan: a low-overhead scan path design methodology, in Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on, 1995, pp. 528 -533.
C. - C. Lin, Marek-Sadowska, M., Cheng, K. - T., and Lee, T. - C., Test point insertion: scan paths through combinational logic, in Design Automation Conference Proceedings 1996, 33rd, 1996, pp. 268 -273.
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Y. Ran and Marek-Sadowska, M., Designing a via-configurable regular fabric, in Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004, 2004, pp. 423 - 426.
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C. - C. Tsai and Marek-Sadowska, M., Logic synthesis for testability, in VLSI, 1996. Proceedings., Sixth Great Lakes Symposium on, 1996, pp. 118 -121.
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Star test: the theory and its applications, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 19, pp. 1052 -1064, 2000.
C. - C. Tsai and Marek-Sadowska, M., Generalized Reed-Muller forms as a tool to detect symmetries, Computers, IEEE Transactions on, vol. 45, pp. 33 -40, 1996.
K. - H. Tsai, Rajski, J., and Marek-Sadowska, M., Scan encoded test pattern generation for BIST, in Test Conference, 1997. Proceedings., International, 1997, pp. 548 -556.
K. - H. Tsai, Tompson, R., Rajski, J., and Marek-Sadowska, M., STAR-ATPG: a high speed test pattern generator for large scan designs, in Test Conference, 1999. Proceedings. International, 1999, pp. 1021 -1030.
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Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay-fault diagnosis using timing information, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Analysis and methodology for multiple-fault diagnosis, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., Delay fault diagnosis using timing information, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
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T. Xiao, Chang, C. - W., and Marek-Sadowska, M., Efficient static timing analysis in presence of crosstalk, in ASIC/SOC Conference, 2000. Proceedings. 13th Annual IEEE International, 2000, pp. 335 -339.