Publications

Found 50 results
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2012
F. Chen, Mittl, S., Shinosky, M., Swift, A., Kontra, R., Anderson, B., Aitken, J., Wang, Y., Kinser, E., Kumar, M., Wang, Y., Kane, T., Feng, K. D., Henson, W. K., Mocuta, D., and Li, Di-an, “Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues”, in Reliability Physics Symposium (IRPS), 2012 IEEE International, 2012, pp. 6A.4.1 -6A.4.9.
F. Chen, Mittl, S., Shinosky, M., Swift, A., Kontra, R., Anderson, B., Aitken, J., Wang, Y., Kinser, E., Kumar, M., Wang, Y., Kane, T., Feng, K. D., Henson, W. K., Mocuta, D., and Li, Di-an, “Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues”, in Reliability Physics Symposium (IRPS), 2012 IEEE International, 2012, pp. 6A.4.1 -6A.4.9.
2011
J. - Y. Wuu, Pikus, F. G., Marek-Sadowska, M., and Rieger, M. L., “Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching”, in Design for Manufacturability through Design-Process Integration V, 2011, vol. 7974.
J. - Y. Wuu, Pikus, F. G., and Marek-Sadowska, M., “Metrics for characterizing machine learning-based hotspot detection methods”, in Quality Electronic Design (ISQED), 2011 12th International Symposium on, 2011, pp. 1 -6.
Y. - S. Su, Wang, D. - C., Chang, S. - C., and Marek-Sadowska, M., “Performance Optimization Using Variable-Latency Design Style”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 19, pp. 1874 -1883, 2011.
J. - Y. Wuu, Pikus, F. G., Torres, A., and Marek-Sadowska, M., “Rapid layout pattern classification”, in Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific, 2011, pp. 781 -786.
2009
J. - Y. Wuu, Pikus, F. G., Torres, A., Marek-Sadowska, M., Singh, V. K., and Rieger, M. L., “Detecting context sensitive hot spots in standard cell libraries”, in Design for Manufacturability through Design-Process Integration III, 2009, vol. 7275, p. 727515.
2008
J. - Y. Wuu, Pikus, F. G., and Marek-Sadowska, M., “Fast and simple modeling of non-rectangular transistors”, in Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series, 2008, vol. 7122.
S. - H. Weng, Kuo, Y. - M., Chang, S. - C., and Marek-Sadowska, M., “Timing analysis considering IR drop waveforms in power gating designs”, in Computer Design, 2008. ICCD 2008. IEEE International Conference on, 2008, pp. 532 -537.
2007
Y. - S. Su, Wang, D. - C., Chang, S. - C., and Marek-Sadowska, M., “An Efficient Mechanism for Performance Optimization of Variable-Latency Designs”, in Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE, 2007, pp. 976 -981.
2006
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Analysis and methodology for multiple-fault diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.
V. Mehta, Wang, Z., Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay fault diagnosis for nonrobust test”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
2005
H. Jiang, Wang, K., and Marek-Sadowska, M., “Clock skew bounds estimation under power supply and process variations”, in GLSVLSI '05: Proceedings of the 15th ACM Great Lakes symposium on VLSI, 2005, pp. 332–336.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay-fault diagnosis using timing information”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
Y. Ran, Kondratyev, A., Tseng, K., Watanabe, Y., and Marek-Sadowska, M., “Eliminating false positives in crosstalk noise analysis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1406 - 1419, 2005.
K. Wang, Ran, Y., Jiang, H., and Marek-Sadowska, M., “General skew constrained clock network sizing based on sequential linear programming”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 773 - 782, 2005.
K. Wang and Marek-Sadowska, M., “On-chip power-supply network optimization using multigrid-based technique”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 407 - 417, 2005.
2004
K. Wang and Marek-Sadowska, M., “Buffer sizing for clock power minimization subject to general skew constraints”, in Design Automation Conference, 2004. Proceedings. 41st, 2004, pp. 159 -164.
K. Wang and Marek-Sadowska, M., “Clock network sizing via sequential linear programming with time-domain analysis”, in ISPD '04: Proceedings of the 2004 international symposium on Physical design, 2004, pp. 182–189.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Delay fault diagnosis using timing information”, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
Z. Wang, Marek-Sadowska, M., Tsai, K. - H., and Rajski, J., “Diagnosis of hold time defects”, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 192 - 199.
Y. Ran, Kondratyev, A., Watanabe, Y., and Marek-Sadowska, M., “Eliminating false positives in crosstalk noise analysis”, in Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings, 2004, vol. 2, pp. 1192 - 1197 Vol.2.
C. - W. Chang, Hsiao, M. - F., Hu, B., Wang, K., Marek-Sadowska, M., Cheng, C. - K., and Chen, S. - J., “Fast postplacement optimization using functional symmetries”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 23, pp. 102 - 118, 2004.
K. Wang and Marek-Sadowska, M., “Potential slack budgeting with clock skew optimization”, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 265 - 271.
2003
B. Hu, Watanabe, Y., and Marek-Sadowska, M., “Gain-based technology mapping for discrete-size cell libraries”, in Design Automation Conference, 2003. Proceedings, 2003, pp. 574 - 579.

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