- Vertical Slit Field Effect Transistor in ultra-low power applications
- Can pin access limit the footprint scaling?
- A Low Energy Network-on-Chip Fabric for 3-D Multi-Core Architectures
- Investigation of emerging middle-of-line poly gate-to-diffusion contact reliability issues
- Metrics for characterizing machine learning-based hotspot detection methods
- A study on cell-level routing for VeSFET circuits
- On Cell Layout-Performance Relationships in VeSFET-Based, High-Density Regular Circuits
Publications
“Power Delivery for Multicore Systems”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 19, pp. 2243 -2255, 2011.
, “Rapid layout pattern classification”, in Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific, 2011, pp. 781 -786.
, “Reliability Analysis and Optimization of Power-Gated ICs”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 19, pp. 457 -468, 2011.
, “Detecting context sensitive hot spots in standard cell libraries”, in Design for Manufacturability through Design-Process Integration III, 2009, vol. 7275, p. 727515.
, “Electromigration study of power-gated grids”, in ISLPED '09: Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design, 2009, pp. 315–318.
, “A study of decoupling capacitor effectiveness in power and ground grid networks”, in Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design, 2009, pp. 653 -658.
, “Timing-Aware Multiple-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 28, pp. 245 -258, 2009.
, “Improving the Resolution of Single-Delay-Fault Diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 27, pp. 932 -945, 2008.
, “Power supply noise aware workload assignment for multi-core systems”, in Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on, 2008, pp. 330 -337.
, “A study of reliability issues in clock distribution networks”, in Computer Design, 2008. ICCD 2008. IEEE International Conference on, 2008, pp. 101 -106.
, “Timing-Aware Multiple-Delay-Fault Diagnosis”, in Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on, 2008, pp. 246 -253.
, “Analysis and optimization of power-gated ICs with multiple power gating configurations”, in Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on, 2007, pp. 783 -790.
, “Electromigration and voltage drop aware power grid optimization for power gated ICs”, in Low Power Electronics and Design (ISLPED), 2007 ACM/IEEE International Symposium on, 2007, pp. 391 -394.
, “Analysis and methodology for multiple-fault diagnosis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 558 - 575, 2006.
, “Analysis of process variation's effect on SRAM's read stability”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -610.
, “Delay fault diagnosis for nonrobust test”, in Quality Electronic Design, 2006. ISQED '06. 7th International Symposium on, 2006, p. 8 pp. -472.
, “Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology”, in Test Conference, 2006. ITC '06. IEEE International, 2006, pp. 1-10.
, “Delay-fault diagnosis using timing information”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1315 - 1325, 2005.
, “Eliminating false positives in crosstalk noise analysis”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 24, pp. 1406 - 1419, 2005.
, “An interconnect insensitive linear time-varying driver model for static timing analysis”, in Quality of Electronic Design, 2005. ISQED 2005. Sixth International Symposium on, 2005, pp. 654 - 661.
, “Delay fault diagnosis using timing information”, in Quality Electronic Design, 2004. Proceedings. 5th International Symposium on, 2004, pp. 485 - 490.
, “Diagnosis of hold time defects”, in Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on, 2004, pp. 192 - 199.
, “Modeling crosstalk induced delay”, in Quality Electronic Design, 2003. Proceedings. Fourth International Symposium on, 2003, pp. 189 - 194.
, “Multiple fault diagnosis using n-detection tests”, in Computer Design, 2003. Proceedings. 21st International Conference on, 2003, pp. 198 - 201.
, “Temporofunctional crosstalk noise analysis”, in Design Automation Conference, 2003. Proceedings, 2003, pp. 860 - 863.
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